In mai 2008 am montat pe mașina care găzduiește acest site (și nu numai) două hard disc-uri Western Digital de 250GB, SATA 2, configurate să funcționeze în RAID 1 (mirror).
După o funcționare aproape continuă de 30.986 ore ( mai bine de 3 ani), unul din ele este pe patul de moarte.
Primul simptom a fost dispariția din matricea Raid realizată software și trecerea acesteia în starea „Degradat”.
Adevarul este că ambele disc-uri au rulat la temperaturi destul de mari, masina fiind amplasată într-un mediu fără climatizare. Mi-au rămas așadar datele importante pe un singur disc în acest moment, lucru care mă deranjează. Trebuie să achiziționez în viitorul apropiat două discuri SATA 2 pentru a avea redundanța datelor.
În acest moment smartctl indică:
Model Family: Western Digital Caviar SE16 Serial ATA family Device Model: WDC WD2500KS-00MJB0 Serial Number: WD-WCANKM102446 Firmware Version: 02.01C03 User Capacity: 250,059,350,016 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Sun Dec 4 18:55:47 2011 EET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: FAILED! Drive failure expected in less than 24 hours. SAVE ALL DATA. See vendor-specific Attribute list for failed Attributes.
SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 200 200 051 Pre-fail Always - 0 3 Spin_Up_Time 235 188 021 Pre-fail Always - 3233 4 Start_Stop_Count 100 100 000 Old_age Always - 127 5 Reallocated_Sector_Ct 104 104 140 Pre-fail Always FAILING_NOW 763 7 Seek_Error_Rate 200 200 051 Pre-fail Always - 0 9 Power_On_Hours 058 058 000 Old_age Always - 30986 10 Spin_Retry_Count 100 100 051 Pre-fail Always - 0 11 Calibration_Retry_Count 100 100 051 Old_age Always - 0 12 Power_Cycle_Count 100 100 000 Old_age Always - 127 190 Airflow_Temperature_Cel 063 037 045 Old_age Always In_the_past 37 194 Temperature_Celsius 113 087 000 Old_age Always - 37 196 Reallocated_Event_Count 001 001 000 Old_age Always - 15166 197 Current_Pending_Sector 200 182 000 Old_age Always - 1 198 Offline_Uncorrectable 200 182 000 Old_age Offline - 3 199 UDMA_CRC_Error_Count 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 160 001 051 Pre-fail Offline In_the_past 1351
SMART Error Log Version: 1
ATA Error Count: 64 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 64 occurred at disk power-on lifetime: 30727 hours (1280 days + 7 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 00 00 00 e0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ec 00 01 00 00 00 00 00 3d+02:05:36.920 IDENTIFY DEVICE
c8 00 01 00 00 00 00 00 3d+02:01:23.505 READ DMA
c8 00 01 80 00 00 00 00 3d+02:01:23.504 READ DMA
c8 00 01 10 00 00 00 00 3d+02:01:23.502 READ DMA
c8 00 01 02 00 00 00 00 3d+02:01:23.501 READ DMA
Error 63 occurred at disk power-on lifetime: 30727 hours (1280 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 01 00 00 00 e0 Device Fault; Error: ABRT 1 sectors at LBA = 0x00000000 = 0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 01 00 00 00 00 00 3d+02:01:23.505 READ DMA
c8 00 01 80 00 00 00 00 3d+02:01:23.504 READ DMA
c8 00 01 10 00 00 00 00 3d+02:01:23.502 READ DMA
c8 00 01 02 00 00 00 00 3d+02:01:23.501 READ DMA
c8 00 01 00 00 00 00 00 3d+02:01:23.500 READ DMA
Error 62 occurred at disk power-on lifetime: 30727 hours (1280 days + 7 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 01 80 00 00 e0 Device Fault; Error: ABRT 1 sectors at LBA = 0x00000080 = 128 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 80 00 00 00 00 3d+02:01:23.504 READ DMA c8 00 01 10 00 00 00 00 3d+02:01:23.502 READ DMA c8 00 01 02 00 00 00 00 3d+02:01:23.501 READ DMA c8 00 01 00 00 00 00 00 3d+02:01:23.500 READ DMA c8 00 01 40 00 00 00 00 3d+02:01:23.498 READ DMA Error 61 occurred at disk power-on lifetime: 30727 hours (1280 days + 7 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 01 10 00 00 e0 Device Fault; Error: ABRT 1 sectors at LBA = 0x00000010 = 16 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 10 00 00 00 00 3d+02:01:23.502 READ DMA c8 00 01 02 00 00 00 00 3d+02:01:23.501 READ DMA c8 00 01 00 00 00 00 00 3d+02:01:23.500 READ DMA c8 00 01 40 00 00 00 00 3d+02:01:23.498 READ DMA c8 00 10 00 02 00 00 00 3d+02:01:23.497 READ DMA Error 60 occurred at disk power-on lifetime: 30727 hours (1280 days + 7 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 61 01 02 00 00 e0 Device Fault; Error: ABRT 1 sectors at LBA = 0x00000002 = 2 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 02 00 00 00 00 3d+02:01:23.501 READ DMA c8 00 01 00 00 00 00 00 3d+02:01:23.500 READ DMA c8 00 01 40 00 00 00 00 3d+02:01:23.498 READ DMA c8 00 10 00 02 00 00 00 3d+02:01:23.497 READ DMA c8 00 10 00 00 00 00 00 3d+02:01:23.495 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
te-a prins cam rau acum…s-a dublat pretul la hdd-uri…din cauza la nush ce inundatii prin Thailanda…al doilea producator de hard-uri dupa China.
La SSD-uri, insa, preturile au ramas la fel dar la capacitatea de care ai nevoie s-ar putea sa fie prea costisitoare solutia asta…